Surface Inspection Equipment

Surface inspection device "IMAGE2000.PCWII"

A surface inspection device with enhanced high-resolution capabilities for wide sheets and improved adaptability to multiple optical conditions!

The comprehensive inspection device IMAGE2000 has achieved simplification and cost reduction of all functions through the computer network. Inspection signal processing + defect image processing + defect image filing + defect map report function are all integrated into one FA computer! The number of connectable cameras was limited to four with the old PCW, but with PCWII, it can now connect up to six cameras. This has improved the high resolution of wide sheets and the ability to accommodate multiple optical conditions. The speed of defect image acquisition has significantly improved, greatly enhancing the capture of discrete defect images. *For more details, please download the catalog.

企業：朝日測器
価格：Other

Image Processing Equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

Surface Inspection Device "IMAGE8000.DHV"

Surface inspection device equipped with a high-speed CCD camera with a video rate of 80/160 MHz (1:1 processing support)!

The surface inspection device "IMAGE8000.DHV" is a system equipped with a high-speed CCD camera operating at 80/160MHz (1:1). It uses a fiber optic camera link extender method, allowing connection between the detector (four cameras) and signal processing with a single fiber optic cable (with a maximum cable length of 200m). 【Features】 ■ Camera Link Extender The fiber optic camera link image transfer unit can transmit images from four Base Configuration cameras using a single fiber optic cable. ■ Digital High-Function Calculation ■ Camera signal extension up to 200m ■ Defect Evaluation Parameters ■ Real-Time Display Function ■ Variety Registration ■ Calibration Mode *For more details, please download the catalog or contact us.

企業：朝日測器
価格：Other

Image Processing Equipment
Other surface treatment equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

Surface Inspection Device "IMAGE8000.DHV"

A surface inspection device with enhanced high-resolution capabilities for wide sheets and improved adaptability to multiple optical conditions!

The IMAGE8000.DHV is a high-speed CCD camera system equipped with an 80/160MHz (1:1) camera. It uses a fiber optic camera link extender method, allowing a single fiber optic cable to connect the detector (four cameras) to the signal processing unit. (The maximum length of the fiber optic cable can be up to 200m.) 【Features】 ○ Surface inspection device for plain sheet-shaped products ○ Up to 12 cameras can be connected to one signal processing unit. ○ Connected cameras can be grouped into multiple configurations (front/back or transmission/reflection, etc.) depending on the equipment configuration and installation conditions. ○ The connection distance between the cameras and the signal processing unit can be extended up to 200m. ○ High-speed/high-resolution digital cameras can be used. ○ The use of high-speed cameras improves the resolution in the flow direction, enabling more precise defect detection. ○ Equipped with gradation comparison processing, point, area, line, and three-line parallel pipeline arithmetic processing, and two-dimensional digital computation functions. ○ Up to six evaluation parameters can be set per camera. ○ Custom specifications, such as marking devices (label markers/pen markers) and slit compatibility, can also be customized. *Please consult us.

企業：朝日測器
価格：Other

Image Processing Equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

Wafer Surface Inspection Machine (VSI-01 Type)

This is a device for surface inspection of wafers after polishing.

- Detects foreign particles of φ0.2μm or larger using a scattered light detection method. - Uses vacuum suction on the backside, ensuring no contact with the wafer surface.

企業：ジャステム
価格：Other

Semiconductor inspection/test equipment
Other semiconductor manufacturing equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

We will find dirt and scratches on the surface of the sheet!

The surface inspection device is an inspection device that detects stains and dirt on the surface of sheets being transported at high speed. It automatically starts inspection through communication with the main unit, eliminating the possibility of forgetting to start the inspection. Similarly, it automatically switches inspection product information, making data switching tasks unnecessary. It can store defective image data for about three months, and searches can be conducted by date, product type, and time. 【Features】 ■ Automatic inspection start function ■ Automatic inspection product switching function ■ Curvature tracking function ■ NG image data management For more details, please refer to the catalog or feel free to contact us.

企業：ティ・アイ・エス鳥栖工場
価格：Other

Visual Inspection Equipment
Other inspection equipment and devices

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

Surface Inspection Device IMAGE2000.DA II

A surface inspection device improved to allow a maximum of 24 connectable cameras!

Surface inspection device equipped with a digital high-performance computing unit, enabling the detection of visually limited defects. ■□■Features■□■ ■ Exhibits inspection capabilities close to visual inspection through surface field inspection and 2D digital computing functions. ■ Developed as a high-precision high-speed inspection system by systematizing advanced technologies such as ultra-fast CCD cameras, dedicated lighting for different inspection items, high-speed digital computing chips, and computers. ■ Equipped with gradation comparison processing, point, image, line, and three-line parallel pipeline computing processing, and 2D digital computing functions. ■ Stable detection is possible with a three-dimensional evaluation method, allowing for simple sorting of defects through three modes of evaluation: density (level) sorting → width sorting → shape sorting. ■ For more details, please download the catalog or contact us.

企業：朝日測器
価格：Other

Visual Inspection Equipment

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

Surface Inspection Equipment - メーカー・企業と製品の一覧